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Residual Current Device testing register per AS/NZS 3760 and AS/NZS 3000
Record each RCD tested. Trip time must be less than 300 ms for 30 mA devices (less than 40 ms at 5x rated). Pass criteria: trips within required time and push-button test operates correctly. Any RCD failing must be replaced immediately.
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Testing Summary
Total RCDs tested: _______ | Passed: _______ | Failed: _______ | Replaced: _______ | Next test due: _______
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